Wang, X.Y. Li, W.F. Huang, Y.K. Luo, Z.M. Lu, X. Yin, J. Shan, H.L. Zhang, R.Y. <br/><br/>
Evaluation of sugarcane introgression lines for resistance to brown rust disease caused by Puccina melanocephala 

<br/><br/><label>Subjects--Topical Terms: </label><br/>CANA DE AÇUCAR<br/>FERRUGEM<br/>VARIEDADE RESISTENTE